SEMI OpenIR  > 半导体超晶格国家重点实验室
双色、微区反射式瞬态光谱测量系统
闫腾飞; 牛秉慧; 高海霞; 李杭; 闫炜; 历巧巧; 张新惠
Rights Holder中国科学院半导体所
Date Available2016-09-28
Country中国
Subtype发明
Subject Area半导体物理
Application Date2015-04-29
Application NumberCN201510212354.7
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/27551
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
闫腾飞,牛秉慧,高海霞,等. 双色、微区反射式瞬态光谱测量系统.
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