Knowledge Management System Of Institute of Semiconductors,CAS
双色、微区反射式瞬态光谱测量系统 | |
闫腾飞; 牛秉慧; 高海霞; 李杭; 闫炜; 历巧巧; 张新惠 | |
Rights Holder | 中国科学院半导体所 |
Date Available | 2016-09-28 |
Country | 中国 |
Subtype | 发明 |
Subject Area | 半导体物理 |
Application Date | 2015-04-29 |
Application Number | CN201510212354.7 |
Document Type | 专利 |
Identifier | http://ir.semi.ac.cn/handle/172111/27551 |
Collection | 半导体超晶格国家重点实验室 |
Recommended Citation GB/T 7714 | 闫腾飞,牛秉慧,高海霞,等. 双色、微区反射式瞬态光谱测量系统. |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
双色、微区反射式瞬态光谱测量系统.pdf(316KB) | 限制开放 | License | Application Full Text |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment