| 发光二极管响应特性的测试系统及方法 | |
| 牛立涛; 关敏; 楚新波; 李弋洋; 曾一平 | |
| Rights Holder | 中国科学院半导体所 |
| Date Available | 2016-08-30 |
| Country | 中国 |
| Subtype | 发明 |
| Subject Area | 半导体材料 |
| Application Date | 2014-09-02 |
| Application Number | CN201410443019.3 |
| Document Type | 专利 |
| Identifier | http://ir.semi.ac.cn/handle/172111/27315 |
| Collection | 中科院半导体材料科学重点实验室 |
| Recommended Citation GB/T 7714 | 牛立涛,关敏,楚新波,等. 发光二极管响应特性的测试系统及方法. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| 发光二极管响应特性的测试系统及方法.pd（640KB） | 限制开放 | License | Application Full Text | |||
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