SEMI OpenIR  > 光电系统实验室
一种具有测距功能的被动成像系统及其测距方法
孔庆善; 崔伟; 王新伟; 周燕; 刘育梁
Rights Holder中国科学院半导体研究所
Date Available2014-04-30
Country中国
Subtype发明
Subject Area光电子学
Application Date2014-01-27
Application NumberCN201410040445.2
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25808
Collection光电系统实验室
Recommended Citation
GB/T 7714
孔庆善,崔伟,王新伟,等. 一种具有测距功能的被动成像系统及其测距方法.
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