一种检测光通讯波段半导体材料发光单光子特性的方法

	一种检测光通讯波段半导体材料发光单光子特性的方法
	周鹏宇; 孙宝权; 窦秀明; 武雪飞; 丁琨
Rights Holder	中国科学院半导体研究所
Date Available	2014-02-12
Country	中国
Subtype	发明
Subject Area	半导体物理
Application Date	2013-11-21
Application Number	CN201310594591.5
Document Type	专利
Identifier	http://ir.semi.ac.cn/handle/172111/25451
Collection	半导体超晶格国家重点实验室
Recommended Citation GB/T 7714	周鹏宇,孙宝权,窦秀明,等. 一种检测光通讯波段半导体材料发光单光子特性的方法.

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