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测量肖特基势垒高度的装置和方法
刘宗顺; 赵德刚; 陈平; 江德生
Rights Holder中国科学院半导体研究所
Date Available2012-10-17
Country中国
Subtype发明
Subject Area光电子学
Application Date2012-06-19
Application NumberCN201210209958.2
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/25310
Collection光电子研究发展中心
Recommended Citation
GB/T 7714
刘宗顺,赵德刚,陈平,等. 测量肖特基势垒高度的装置和方法.
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测量肖特基势垒高度的装置和方法.pdf(880KB) 限制开放LicenseApplication Full Text
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