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一种用于测量低波数拉曼信号的单光栅拉曼光谱测试系统; 一种用于测量低波数拉曼信号的单光栅拉曼光谱测试系统
谭平恒; 韩文鹏; 厉巧巧
Rights Holder中国科学院半导体研究所
Date Available2012-08-29 ; 2012-03-14 ; 2012-08-29
Country中国
Subtype发明
Abstract 本发明公开了一种用于测量低波数拉曼信号的单光栅拉曼光谱测试系统,包括:激光源;体光栅带通滤光片,位于激光光路上,用于过滤掉激光的等离子线而纯化激光线;分束器,位于体光栅带通滤光片将激光反射后的光路上,将经体光栅带通滤光片纯化的激光反射到显微物镜;显微物镜,用于将激光聚焦到样品上来激发拉曼光谱信号;三个依次排列的体光栅陷波滤光片,位于样品拉曼信号光经显微物镜收集并穿过分束器之后的光路上;聚焦透镜,用于将拉曼信号汇聚入单光栅光谱仪的入口处;以及含探测器的单光栅光谱仪,用来收集拉曼信号。本发明可以用来探测小至5波数的拉曼光谱信号,使显微拉曼光谱仪在测低波数拉曼光谱方面比红外光谱仪更具有显著的优势。
metadata_83半导体超晶格国家重点实验室
Application Date2011-09-22
Patent NumberCN102374901A
Language中文
Status公开
Application Number CN201110283005.6
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/23322
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
谭平恒,韩文鹏,厉巧巧. 一种用于测量低波数拉曼信号的单光栅拉曼光谱测试系统, 一种用于测量低波数拉曼信号的单光栅拉曼光谱测试系统. CN102374901A.
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