SEMI OpenIR  > 光电系统实验室
数字化高精度相位检测器
何俊; 李芳; 刘育梁
Rights Holder中国科学院半导体研究所
Date Available2011-08-31
Country中国
Subtype发明
Abstract本发明公开了一种数字化高精度相位检测器,包括模数转换模块(10)、滤波器模块(20)、相位差计算模块(30)、相位修正模块(40)和相位检测结果存储及显示模块(50)。本发明提供的数字化高精度相位检测器,具有精度高、量程宽、频段宽、操作方便等优点,能工作于谐波环境。
metadata_83光电系统实验室
Patent NumberCN200910236386.5
Language中文
Status公开
Application NumberCN200910236386.5
Patent Agent周国城
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/22533
Collection光电系统实验室
Recommended Citation
GB/T 7714
何俊,李芳,刘育梁. 数字化高精度相位检测器. CN200910236386.5.
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CN200910236386.5.pdf(585KB) 限制开放--Application Full Text
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