Upconversion emission of a Er3+-doped glass microsphere under 633 nm excitation

SEMI OpenIR > 中国科学院半导体研究所（2009年前）

	Upconversion emission of a Er3+-doped glass microsphere under 633 nm excitation
	Wang JY; Ji GR; Jin P; Zhao LJ; Zhang CZ; Wang JY Bewing Univ Technol Coll Appl Sci Beijing 100022 Peoples R China. 电子邮箱地址: wangjiyou@bjut.edu.cn
	2004
会议名称	8th IUMRS International Conference on Electronic Materials (IUMRS/ICEM)
会议录名称	MICROELECTRONICS JOURNAL, 35 (4)
页码	353-355
会议日期	JUN 10-14, 2002
会议地点	XIAN, PEOPLES R CHINA
出版地	THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND
出版者	ELSEVIER SCI LTD
ISSN	0026-2692
部门归属	bewing univ technol, coll appl sci, beijing 100022, peoples r china; chinese acad sci, inst semicond, key lab semicond mat sci, beijing, peoples r china; nankai univ, coll phys sci, phtoton ctr, tianjin, peoples r china
摘要	In this work, The TBS glass microspheres doped with Er3+ for morphology-dependent resonances of upconversion emission were designed. The glass sample components are 25TiO(2)-27BaCO(3)-8Ba(NO3)(2)-6ZnO(2)-9CaCO(3)-5H(3)BO(3)-10SiO(2)-7water glass-3Er(2)O(3) (wt%), and the emission spectra of TBS glass and a TBS glass microsphere (about 48 mum in diameter) were measured under 633 nm excitation and discussed. The strong morphology-dependent resonances of upconversion luminescences in the microsphere were observed. The observed resonances could be assigned by using the well-known Lorenz-Mie Formalism. (C) 2003 Elsevier Ltd. All rights reserved.
关键词	Upconversion Doped-er3++ Glass Microsphere Morphology-dependent Resonances
学科领域	半导体器件
主办者	Chinese Mat Res Soc.; Int Union Mat Res Soc.
收录类别	CPCI-S
语种	英语
文献类型	会议论文
条目标识符	http://ir.semi.ac.cn/handle/172111/13603
专题	中国科学院半导体研究所（2009年前）
通讯作者	Wang JY Bewing Univ Technol Coll Appl Sci Beijing 100022 Peoples R China. 电子邮箱地址: wangjiyou@bjut.edu.cn
推荐引用方式 GB/T 7714	Wang JY,Ji GR,Jin P,et al. Upconversion emission of a Er3+-doped glass microsphere under 633 nm excitation[C]. THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD OX5 1GB, OXON, ENGLAND:ELSEVIER SCI LTD,2004:353-355.

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