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Thermal analysis of the cavity facet for an 808 nm semiconductor laser by using near-field scanning optical microscopy 期刊论文
Journal of Semiconductors, 2010, 卷号: 31, 期号: 10, 页码: 104007-1-104007-5
Authors:  Rao Lan;  Song Guofeng;  Chen Lianghui
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测量半导体激光器腔面温度的测试系统 专利
专利类型: 发明, 专利号: CN201010564571.X, 公开日期: 2011-08-31, 2011-08-31, 2011-08-31
Inventors:  裘利平;  饶兰
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