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电子束诱导单壁碳纳米管不稳定性的新观察 期刊论文
物理学报, 2012, 卷号: 61, 期号: 3, 页码: 036401-1-036401-6
Authors:  李论雄,苏江滨,吴燕,朱贤方,王占国
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聚焦电子束诱导碳沉积实现纳米线表面可控修饰 期刊论文
科学通报, 2010, 卷号: 55, 期号: 13, 页码: 1288-1293
Authors:  苏江滨;  朱贤方;  李论雄;  王占国
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聚焦电子束诱导SiOx纳米线表面碳沉积的分形生长 期刊论文
科学通报, 2010, 卷号: 55, 期号: 16, 页码: 1632-1637
Authors:  苏江滨;  朱贤方;  李论雄;  王连洲;  王占国
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CVD制备SiO_x纳米线的各个生长阶段的直接实验证据 期刊论文
科学通报, 2009, 卷号: 54, 期号: 19, 页码: 2988-2992
Authors:  吴燕;  黄胜利;  朱贤方;  李论雄;  王占国;  王连洲
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电子束辐照下单壁碳纳米管的结构不稳定性 期刊论文
功能材料与器件学报, 2008, 卷号: 14, 期号: 1, 页码: 268-272
Authors:  苏江滨;  孟焘;  李论雄;  王占国;  朱贤方
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Shrinkage of nanocavities in silicon during electron beam irradiation 期刊论文
JOURNAL OF APPLIED PHYSICS, 2006, 卷号: 100, 期号: 3, 页码: Art.No.034304
Authors:  Zhu XF (Zhu Xianfang);  Zhu, XF, Xiamen Univ, Dept Phys, Lab Low Dimens Nanostruct, Xiamen 316005, Peoples R China. E-mail: xianfangzhu@hotmail.com
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Preferential Amorphization  Ion irradiatIon  Amorphous Si  In-situ  Voids  
Nanoinstabilities as revealed by shrinkage of nanocavities in silicon during irradiation 期刊论文
INTERNATIONAL JOURNAL OF NANOTECHNOLOGY, 2006, 卷号: 3, 期号: 4 Sp.Iss.SI, 页码: 492-516
Authors:  Zhu, XF (Zhu, Xianfang);  Wang, ZG (Wang, Zhanguo);  Zhu, XF, Univ Illinois, Mat Res Lab, Urbana, IL 61801 USA. 电子邮箱地址: zhux@xmu.edu.cn;  zgwang@red.semi.ac.cn
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Nanocavity  Nanoparticle  Nanoinstabilities  Open Volume Defect  Thermodynamic Nonequilibrium  Nanosize  Nanotime  Energetic Beam Irradiation  Amorphous Structure  Nanocurvature  Surface Energy  Walled Carbon Nanotubes  Amorphous-silicon  Ion irradiatIon  Preferential Amorphization  In-situ  Instability  Beam  Implantation  Cavities  Point  
制备几种典型复合纳米线的相关实验及其分析 期刊论文
材料导报, 2006, 卷号: 20, 期号: 11, 页码: 122-125
Authors:  吴燕;  朱贤方;  王占国
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用MOCVD法生长GaN基自组装量子点的相关实验及其分析 期刊论文
稀有金属材料与工程, 2005, 卷号: 34, 期号: 12, 页码: 1849-1853
Authors:  孟焘;  朱贤方;  王占国
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