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Energy band alignment of SiO2/ZnO interface determined by x-ray photoelectron spectroscopy 期刊论文
JOURNAL OF APPLIED PHYSICS, 2009, 卷号: 106, 期号: 4, 页码: Art. No. 043709
Authors:  You JB;  Zhang XW;  Song HP;  Ying J;  Guo Y;  Yang AL;  Yin ZG;  Chen NF;  Zhu QS;  You JB Chinese Acad Sci Inst Semicond Key Lab Semicond Mat Sci Beijing 100083 Peoples R China. E-mail Address: jbyou@semi.ac.cn
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Light-emitting-diodes  Zno  Electroluminescence  Offsets