(Note: the search results are based on claimed items)

Browse/Search Results:  1-1 of 1 Help

Selected(0)Clear Items/Page:    Sort:
Energy band alignment of SiO2/ZnO interface determined by x-ray photoelectron spectroscopy 期刊论文
JOURNAL OF APPLIED PHYSICS, 2009, 卷号: 106, 期号: 4, 页码: Art. No. 043709
Authors:  You JB;  Zhang XW;  Song HP;  Ying J;  Guo Y;  Yang AL;  Yin ZG;  Chen NF;  Zhu QS;  You JB Chinese Acad Sci Inst Semicond Key Lab Semicond Mat Sci Beijing 100083 Peoples R China. E-mail Address:
Adobe PDF(420Kb)  |  Favorite  |  View/Download:1962/637  |  Submit date:2010/03/08
Light-emitting-diodes  Zno  Electroluminescence  Offsets