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砷化镓基1.5微米量子阱结构及其外延生长方法 专利
专利类型: 发明, 申请日期: 2007-04-25, 公开日期: 2009-06-04, 2009-06-11
发明人:  牛智川;  倪海桥;  韩勤;  张石勇;  吴东海;  赵欢;  杨晓红;  彭红玲;  周志强;  熊永华;  吴荣汉
Adobe PDF(588Kb)  |  收藏  |  浏览/下载：1417/248  |  提交时间：2009/06/11
无权访问的条目 期刊论文
作者:  Lu, X;  Han, P;  Quan, Y;  Ran, Q;  Gao, L;  Zeng, F;  Zhao, C;  Yu, J;  Lu, X, Chinese Acad Sci, Inst Semicond, State Key Lab Integrated Optelect, Beijing, Peoples R China. 电子邮箱地址: lxd2211@sina.com
Adobe PDF(1371Kb)  |  收藏  |  浏览/下载：897/247  |  提交时间：2010/03/08
Micro-raman investigation of defects in a 4H-SiC homoepilayer 会议论文
Silicon Carbide and Related Materials 2006丛书标题: MATERIALS SCIENCE FORUM, Newcastle upon Tyne, ENGLAND, SEP, 2006
作者:  Liu, XF (Liu, X. F.);  Sun, GS (Sun, G. S.);  Li, JM (Li, J. M.);  Zhao, YM (Zhao, Y. M.);  Li, JY (Li, J. Y.);  Wang, L (Wang, L.);  Zhao, WS (Zhao, W. S.);  Luo, MC (Luo, M. C.);  Zeng, YP (Zeng, Y. P.);  Liu, XF, Chinese Acad Sci, Inst Semicond, Novel Semicond Mat Lab, Beijing 100083, Peoples R China.
Adobe PDF(1318Kb)  |  收藏  |  浏览/下载：1311/197  |  提交时间：2010/03/29
Micro-raman  4h-sic  Defects  3c-inclusions  Triangle-shaped Inclusion  Epitaxial Layers  Silicon-carbide  
Vertical PIN ultraviolet photodetectors based on 4H-SiC homoepilayers 会议论文
Physica Status Solidi C - Current Topics in Solid State Physics丛书标题: PHYSICA STATUS SOLIDI C-CURRENT TOPICS IN SOLID STATE PHYSICS, Vancouver, CANADA, AUG 13-17, 2006
作者:  Liu, XF (Liu, X. F.);  Sun, GS (Sun, G. S.);  Li, JM (Li, J. M.);  Ning, J (Ning, J.);  Zhao, YM (Zhao, Y. M.);  Luo, MC (Luo, M. C.);  Wang, L (Wang, L.);  Zhao, WS (Zhao, W. S.);  Zeng, YP (Zeng, Y. P.);  Liu, XF, Chinese Acad Sci, Inst Semicond, Novel Semicond Mat Lab, Beijing 100083, Peoples R China.
Adobe PDF(209Kb)  |  收藏  |  浏览/下载：1247/273  |  提交时间：2010/03/29
Avalanche Photodiodes  Area