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Positive and negative effects of oxygen in thermal annealing of p-type GaN 期刊论文
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2012, 卷号: 27, 期号: 8, 页码: 085017
Authors:  Wu LL (Wu, L. L.);  Zhao DG (Zhao, D. G.);  Jiang DS (Jiang, D. S.);  Chen P (Chen, P.);  Le LC (Le, L. C.);  Li L (Li, L.);  Liu ZS (Liu, Z. S.);  Zhang SM (Zhang, S. M.);  Zhu JJ (Zhu, J. J.);  Wang H (Wang, H.);  Zhang BS (Zhang, B. S.);  Yang H (Yang, H.)
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