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In-situ SEM investigation of sub-microscale deformation fields around a crack-tip in silicon 期刊论文
Optics and Lasers in Engineering, 2012, 卷号: 50, 期号: 12, 页码: 1694-1698
Authors:  Li, J.J;  Zhao, C.W;  Xing, Y.M;  Hou, X.H;  Fan, Z.C;  Jin, Y.J;  Wang, Y
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Target detection against strong light based on gate viewing 期刊论文
Proceedings of SPIE- The International Society for Optical Engineering, 2011, 卷号: 8200, 页码: 82000V
Authors:  Xinwei, Wang;  Yan, Zhou;  Songtao, Fan;  Yuliang, Liu;  Xinwei, W.(
Adobe PDF(911Kb)  |  Favorite  |  View/Download:811/262  |  Submit date:2012/06/14
Optical Instruments  Target Tracking  Technology