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Sensitivity of Total-Dose Radiation Hardness of SIMOX Buried Oxides to Doses of Nitrogen Implantation into Buried Oxides 期刊论文
半导体学报, 2005, 卷号: 26, 期号: 5, 页码: 862-866
Authors:  Zheng Zhongshan;  Liu Zhongli;  Zhang Guoqiang;  Li Ning;  Li Guohua;  Ma Hongzhi;  Zhang Enxia;  Zhang Zhengxuan;  Wang Xi
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N型6H-SiCMOS电容的电学特性 期刊论文
半导体学报, 2001, 卷号: 22, 期号: 6, 页码: 755-759
Authors:  王姝睿;  刘忠立;  梁桂荣;  梁秀芹;  马红芝
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