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Accurate vibration detection of a rough surface - art. no. 683118 会议论文
NANOPHOTONICS,NANOSTRUCTURE,AND NANOMETROLOGY II, Beijing, PEOPLES R CHINA, NOV 12-14, 2007
作者:  Zeng, HL;  Zhou, Y;  Fan, ST;  He, J;  Zeng, HL, Chinese Acad Sci, Inst Semicond, Beijing 100864, Peoples R China.
Adobe PDF(218Kb)  |  收藏  |  浏览/下载：1700/372  |  提交时间：2010/03/09
Measurement Of Microvibration  Nanometrology  Interferometry  Vibration Detection  
Single steady frequency and narrow line width external cavity semiconductor laser 会议论文
ADVANCED CHARACTERIZATION TECHNIQUES FOR OPTICS, SEMICONDUCTORS, AND NANOTECHNOLOGIES, 5188, SAN DIEGO, CA, AUG 03-05, 2003
作者:  Zhao WR;  Jiang PF;  Xie FZ;  Zhao WR Chinese Acad Sci Inst Semicond Beijing 100083 Peoples R China.
Adobe PDF(275Kb)  |  收藏  |  浏览/下载：1351/257  |  提交时间：2010/10/29
External Cavity Semiconductor Laser  Light Feedback  Single Longitudinal Mode  Spectral Line Width  Feedback  Diode