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title: 探测半导体能带结构高阶临界点的新方法
author: 谭平恒;  徐仲英;  罗向东;  葛惟昆
metadata_47: 2007-7-11
Appears in Collections:半导体研究所机构知识库_专利

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谭平恒;徐仲英;罗向东;葛惟昆,探测半导体能带结构高阶临界点的新方法 ,200510130769,20051228
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