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A Low-Cost Improved Method of Raw Bit Error Rate Estimation for NAND Flash Memory of High Storage Density
Kainan Ma;   Ming Liu;   Tao Li;   Yibo Yin;   Hongda Chen
2020
Source PublicationELECTRONICS
Volume9Issue:11Pages:1900
Indexed BySCI
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/30043
Collection光电子研究发展中心
Recommended Citation
GB/T 7714
Kainan Ma; Ming Liu; Tao Li; Yibo Yin; Hongda Chen;. A Low-Cost Improved Method of Raw Bit Error Rate Estimation for NAND Flash Memory of High Storage Density[J]. ELECTRONICS,2020,9(11):1900.
APA Kainan Ma; Ming Liu; Tao Li; Yibo Yin; Hongda Chen;.(2020).A Low-Cost Improved Method of Raw Bit Error Rate Estimation for NAND Flash Memory of High Storage Density.ELECTRONICS,9(11),1900.
MLA Kainan Ma; Ming Liu; Tao Li; Yibo Yin; Hongda Chen;."A Low-Cost Improved Method of Raw Bit Error Rate Estimation for NAND Flash Memory of High Storage Density".ELECTRONICS 9.11(2020):1900.
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