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Image charge interaction correction in charged-defect calculations
Zhao-Jun Suo;   Jun-Wei Luo;   Shu-Shen Li;   Lin-Wang Wang
2020
Source PublicationPHYSICAL REVIEW B
Volume102Pages:174110
Indexed BySCI
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/30012
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
Zhao-Jun Suo; Jun-Wei Luo; Shu-Shen Li; Lin-Wang Wang. Image charge interaction correction in charged-defect calculations[J]. PHYSICAL REVIEW B,2020,102:174110.
APA Zhao-Jun Suo; Jun-Wei Luo; Shu-Shen Li; Lin-Wang Wang.(2020).Image charge interaction correction in charged-defect calculations.PHYSICAL REVIEW B,102,174110.
MLA Zhao-Jun Suo; Jun-Wei Luo; Shu-Shen Li; Lin-Wang Wang."Image charge interaction correction in charged-defect calculations".PHYSICAL REVIEW B 102(2020):174110.
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