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A Compact Multifrequency Measurement System Based on an Integrated Frequency-Scanning Generator†
Nuannuan Shi ;   Tengfei Hao ;   Wei Li ;   Ming Li
2020
Source PublicationAPPLIED SCIENCES-BASEL
Volume10Issue:23Pages:8571
Indexed BySCI
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/30006
Collection集成光电子学国家重点实验室
Recommended Citation
GB/T 7714
Nuannuan Shi ; Tengfei Hao ; Wei Li ; Ming Li. A Compact Multifrequency Measurement System Based on an Integrated Frequency-Scanning Generator†[J]. APPLIED SCIENCES-BASEL,2020,10(23):8571.
APA Nuannuan Shi ; Tengfei Hao ; Wei Li ; Ming Li.(2020).A Compact Multifrequency Measurement System Based on an Integrated Frequency-Scanning Generator†.APPLIED SCIENCES-BASEL,10(23),8571.
MLA Nuannuan Shi ; Tengfei Hao ; Wei Li ; Ming Li."A Compact Multifrequency Measurement System Based on an Integrated Frequency-Scanning Generator†".APPLIED SCIENCES-BASEL 10.23(2020):8571.
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