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Quantitative investigation of intrinsic shear strain and asymmetric interface conditions in semiconductor superlattices
Yuan Li;  Fengqi Liu;   Xiaoling Ye;   Yu Liu;   Jiawei Wang;   Yonghai Chen
2019
Source PublicationJournal of Applied Physics
Volume126Issue:6Pages:065704
Indexed BySCI
Language英语
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/29556
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
Yuan Li;Fengqi Liu; Xiaoling Ye; Yu Liu; Jiawei Wang; Yonghai Chen. Quantitative investigation of intrinsic shear strain and asymmetric interface conditions in semiconductor superlattices[J]. Journal of Applied Physics,2019,126(6):065704.
APA Yuan Li;Fengqi Liu; Xiaoling Ye; Yu Liu; Jiawei Wang; Yonghai Chen.(2019).Quantitative investigation of intrinsic shear strain and asymmetric interface conditions in semiconductor superlattices.Journal of Applied Physics,126(6),065704.
MLA Yuan Li;Fengqi Liu; Xiaoling Ye; Yu Liu; Jiawei Wang; Yonghai Chen."Quantitative investigation of intrinsic shear strain and asymmetric interface conditions in semiconductor superlattices".Journal of Applied Physics 126.6(2019):065704.
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