SEMI OpenIR  > 中科院半导体材料科学重点实验室
Interfacial influence on electrical injection and transport characterization of CoFeB|MgO|GaAs-InGaAs quantum wells hetero-structure
Y. Tian ;   C. Zhang ;   C. Xiao ;   R. Wang ;   L. Xu ;   X. Devaux ;   Pierre Renucci ;   B. Xu ;   S. Liang ;   C. Yang ;   Y. Lu
2019
Source PublicationApplied Surface Science
Volume473Pages:230-234
Indexed BySCI
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/29508
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
Y. Tian ; C. Zhang ; C. Xiao ; R. Wang ; L. Xu ; X. Devaux ; Pierre Renucci ; B. Xu ; S. Liang ; C. Yang ; Y. Lu. Interfacial influence on electrical injection and transport characterization of CoFeB|MgO|GaAs-InGaAs quantum wells hetero-structure[J]. Applied Surface Science,2019,473:230-234.
APA Y. Tian ; C. Zhang ; C. Xiao ; R. Wang ; L. Xu ; X. Devaux ; Pierre Renucci ; B. Xu ; S. Liang ; C. Yang ; Y. Lu.(2019).Interfacial influence on electrical injection and transport characterization of CoFeB|MgO|GaAs-InGaAs quantum wells hetero-structure.Applied Surface Science,473,230-234.
MLA Y. Tian ; C. Zhang ; C. Xiao ; R. Wang ; L. Xu ; X. Devaux ; Pierre Renucci ; B. Xu ; S. Liang ; C. Yang ; Y. Lu."Interfacial influence on electrical injection and transport characterization of CoFeB|MgO|GaAs-InGaAs quantum wells hetero-structure".Applied Surface Science 473(2019):230-234.
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