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Probing the edge-related properties of atomically thin MoS 2 at nanoscale
Teng-Xiang Huang;  Xin Cong;  Si-Si Wu;  Kai-Qiang Lin;  Xu Yao;  Yu-Han He;  Jiang-Bin Wu;  Yi-Fan Bao;  Sheng-Chao Huang;  Xiang Wang;  Ping-Heng Tan;  Bin Ren
2019
Source PublicationNature communications
Volume10Pages:5544
Indexed BySCI
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/29450
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
Teng-Xiang Huang;Xin Cong;Si-Si Wu;Kai-Qiang Lin;Xu Yao;Yu-Han He;Jiang-Bin Wu;Yi-Fan Bao;Sheng-Chao Huang;Xiang Wang;Ping-Heng Tan;Bin Ren. Probing the edge-related properties of atomically thin MoS 2 at nanoscale[J]. Nature communications,2019,10:5544.
APA Teng-Xiang Huang;Xin Cong;Si-Si Wu;Kai-Qiang Lin;Xu Yao;Yu-Han He;Jiang-Bin Wu;Yi-Fan Bao;Sheng-Chao Huang;Xiang Wang;Ping-Heng Tan;Bin Ren.(2019).Probing the edge-related properties of atomically thin MoS 2 at nanoscale.Nature communications,10,5544.
MLA Teng-Xiang Huang;Xin Cong;Si-Si Wu;Kai-Qiang Lin;Xu Yao;Yu-Han He;Jiang-Bin Wu;Yi-Fan Bao;Sheng-Chao Huang;Xiang Wang;Ping-Heng Tan;Bin Ren."Probing the edge-related properties of atomically thin MoS 2 at nanoscale".Nature communications 10(2019):5544.
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