Defects coupling impacts on mono-layer WSe 2 tunneling field-effect transistors

	Defects coupling impacts on mono-layer WSe 2 tunneling field-effect transistors
	Jixuan Wu ; Xiaolei Ma ; Jiezhi Chen ; Xiangwei Jiang
	2019
Source Publication	Applied Physics Express
Volume	12 Pages:034001
Indexed By	SCI
Document Type	期刊论文
Identifier	http://ir.semi.ac.cn/handle/172111/29410
Collection	半导体超晶格国家重点实验室
Recommended Citation GB/T 7714	Jixuan Wu ; Xiaolei Ma ; Jiezhi Chen ; Xiangwei Jiang. Defects coupling impacts on mono-layer WSe 2 tunneling field-effect transistors[J]. Applied Physics Express,2019,12:034001.
APA	Jixuan Wu ; Xiaolei Ma ; Jiezhi Chen ; Xiangwei Jiang.(2019).Defects coupling impacts on mono-layer WSe 2 tunneling field-effect transistors.Applied Physics Express,12,034001.
MLA	Jixuan Wu ; Xiaolei Ma ; Jiezhi Chen ; Xiangwei Jiang."Defects coupling impacts on mono-layer WSe 2 tunneling field-effect transistors".Applied Physics Express 12(2019):034001.

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