In Operando Micro-Raman Three-Dimensional Thermometry with Diffraction-Limit Spatial Resolution for GaN-based Light-Emitting Diodes | |
T. Park; Yong-Jing Guan; Zhi-Qiang Liu; Yong Zhang | |
2018 | |
Source Publication | PHYSICAL REVIEW APPLIED
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Volume | 10Issue:3Pages:034049 |
Indexed By | SCI |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/29368 |
Collection | 光电子研究发展中心 |
Recommended Citation GB/T 7714 | T. Park; Yong-Jing Guan; Zhi-Qiang Liu; Yong Zhang. In Operando Micro-Raman Three-Dimensional Thermometry with Diffraction-Limit Spatial Resolution for GaN-based Light-Emitting Diodes[J]. PHYSICAL REVIEW APPLIED,2018,10(3):034049. |
APA | T. Park; Yong-Jing Guan; Zhi-Qiang Liu; Yong Zhang.(2018).In Operando Micro-Raman Three-Dimensional Thermometry with Diffraction-Limit Spatial Resolution for GaN-based Light-Emitting Diodes.PHYSICAL REVIEW APPLIED,10(3),034049. |
MLA | T. Park; Yong-Jing Guan; Zhi-Qiang Liu; Yong Zhang."In Operando Micro-Raman Three-Dimensional Thermometry with Diffraction-Limit Spatial Resolution for GaN-based Light-Emitting Diodes".PHYSICAL REVIEW APPLIED 10.3(2018):034049. |
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刘志强In Operando Micro(1197KB) | 期刊论文 | 作者接受稿 | 限制开放 | CC BY-NC-SA | Application Full Text |
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