Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca)

	Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca)
	Congxin Xia; Wenqi Xiong; Juan Du; Tianxing Wang; Zhongming Wei; Jingbo Li
	2018
Source Publication	JOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume	51 Issue:1 Pages:015107
Indexed By	SCI
Document Type	期刊论文
Identifier	http://ir.semi.ac.cn/handle/172111/29253
Collection	半导体超晶格国家重点实验室
Recommended Citation GB/T 7714	Congxin Xia;Wenqi Xiong;Juan Du;Tianxing Wang;Zhongming Wei;Jingbo Li. Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca)[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2018,51(1):015107.
APA	Congxin Xia;Wenqi Xiong;Juan Du;Tianxing Wang;Zhongming Wei;Jingbo Li.(2018).Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca).JOURNAL OF PHYSICS D-APPLIED PHYSICS,51(1),015107.
MLA	Congxin Xia;Wenqi Xiong;Juan Du;Tianxing Wang;Zhongming Wei;Jingbo Li."Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca)".JOURNAL OF PHYSICS D-APPLIED PHYSICS 51.1(2018):015107.

Related Services

Bookmark

Google Scholar

Similar articles in Bing Scholar

Terms of Use

No data!

Social Bookmark/Share

All comments (0)

No comment.

The comment function is only available to registered usersLog In

If you have any objections to this item, please fill out the form below and the administrator will contact you as soon as possible.
Content:
Email：	*
Institution:
Verification Code:	Refresh

Any comments and suggestions are welcomed.
Title:	*
Content:
Email：	*
Verification Code:	Refresh

中国科学院半导体研究所机构知识库