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Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca)
Congxin Xia;  Wenqi Xiong;  Juan Du;  Tianxing Wang;  Zhongming Wei;  Jingbo Li
2018
Source PublicationJOURNAL OF PHYSICS D-APPLIED PHYSICS
Volume51Issue:1Pages:015107
Indexed BySCI
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/29253
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
Congxin Xia;Wenqi Xiong;Juan Du;Tianxing Wang;Zhongming Wei;Jingbo Li. Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca)[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2018,51(1):015107.
APA Congxin Xia;Wenqi Xiong;Juan Du;Tianxing Wang;Zhongming Wei;Jingbo Li.(2018).Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca).JOURNAL OF PHYSICS D-APPLIED PHYSICS,51(1),015107.
MLA Congxin Xia;Wenqi Xiong;Juan Du;Tianxing Wang;Zhongming Wei;Jingbo Li."Robust electronic and mechanical properties to layer number in 2D wide-gap X(OH) 2 (X = Mg, Ca)".JOURNAL OF PHYSICS D-APPLIED PHYSICS 51.1(2018):015107.
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