SEMI OpenIR  > 中科院半导体材料科学重点实验室
Stress mapping of a strain superlattice using scanning moiré fringe imaging
Huihui Wen;  Hongye Zhang;  Zhanwei Liu;  Chao Liu;  Shuman Liu;  Xinan Yang;  Fengqi Liu;  Huimin Xie
2018
Source PublicationApplied Physics Letters
Volume113Issue:3Pages:031905
Indexed BySCI
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/29164
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
Huihui Wen;Hongye Zhang;Zhanwei Liu;Chao Liu;Shuman Liu;Xinan Yang;Fengqi Liu;Huimin Xie. Stress mapping of a strain superlattice using scanning moiré fringe imaging[J]. Applied Physics Letters,2018,113(3):031905.
APA Huihui Wen;Hongye Zhang;Zhanwei Liu;Chao Liu;Shuman Liu;Xinan Yang;Fengqi Liu;Huimin Xie.(2018).Stress mapping of a strain superlattice using scanning moiré fringe imaging.Applied Physics Letters,113(3),031905.
MLA Huihui Wen;Hongye Zhang;Zhanwei Liu;Chao Liu;Shuman Liu;Xinan Yang;Fengqi Liu;Huimin Xie."Stress mapping of a strain superlattice using scanning moiré fringe imaging".Applied Physics Letters 113.3(2018):031905.
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