SEMI OpenIR  > 半导体超晶格国家重点实验室
Single photon emissions from InAs/GaAs quantum dots embedded in GaAs/SiO 2 hybrid microdisks
P.Y. Yue ;   X.M. Dou ;   H.Y. Wang ;   B. Ma ;   Z.C. Niu ;   B.Q. Sun
2018
Source PublicationOptics Communications
Volume411Pages:114-118
Indexed BySCI
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/29006
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
P.Y. Yue ; X.M. Dou ; H.Y. Wang ; B. Ma ; Z.C. Niu ; B.Q. Sun. Single photon emissions from InAs/GaAs quantum dots embedded in GaAs/SiO 2 hybrid microdisks[J]. Optics Communications,2018,411:114-118.
APA P.Y. Yue ; X.M. Dou ; H.Y. Wang ; B. Ma ; Z.C. Niu ; B.Q. Sun.(2018).Single photon emissions from InAs/GaAs quantum dots embedded in GaAs/SiO 2 hybrid microdisks.Optics Communications,411,114-118.
MLA P.Y. Yue ; X.M. Dou ; H.Y. Wang ; B. Ma ; Z.C. Niu ; B.Q. Sun."Single photon emissions from InAs/GaAs quantum dots embedded in GaAs/SiO 2 hybrid microdisks".Optics Communications 411(2018):114-118.
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