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Optical rectification and Pockels effect as a method to detect the properties of Si surfaces
Qi Wang; Li Zhang; Xin Wang; Haiyan Quan; Zhanguo Chen; Jihong Zhao; Xiuhuan Liu; Lixin Hou; YanjunGao; Gang Jia; Shaowu Chen
2017
Source PublicationCHINESE OPTICS LETTERS
Volume15Issue:6Pages:062401
Subject Area光电子学
Indexed BySCI
Date Available2018-07-09
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/28753
Collection光电子研究发展中心
Recommended Citation
GB/T 7714
Qi Wang,Li Zhang,Xin Wang,et al. Optical rectification and Pockels effect as a method to detect the properties of Si surfaces[J]. CHINESE OPTICS LETTERS,2017,15(6):062401.
APA Qi Wang.,Li Zhang.,Xin Wang.,Haiyan Quan.,Zhanguo Chen.,...&Shaowu Chen.(2017).Optical rectification and Pockels effect as a method to detect the properties of Si surfaces.CHINESE OPTICS LETTERS,15(6),062401.
MLA Qi Wang,et al."Optical rectification and Pockels effect as a method to detect the properties of Si surfaces".CHINESE OPTICS LETTERS 15.6(2017):062401.
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