SEMI OpenIR  > 半导体超晶格国家重点实验室
Measurement of the inhomogeneous broadening of a bi-exciton state in a quantum dot using Franson-type nonlocal interference
YONG-NAN SUN; YANG ZOU; GENG CHEN; JIAN-SHUN TANG; HAI-QIAO NI; MI-FENG LI; GUO-WEI ZHA; ZHI-CHUAN NIU; YONG-JIAN HAN; CHUAN-FENG LI; GUANG-CAN GUO
2017
Source PublicationOPTICS EXPRESS
Volume25Issue:3Pages:1778-1788
Subject Area半导体物理
Indexed BySCI
Date Available2018-06-15
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/28609
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
YONG-NAN SUN,YANG ZOU,GENG CHEN,et al. Measurement of the inhomogeneous broadening of a bi-exciton state in a quantum dot using Franson-type nonlocal interference[J]. OPTICS EXPRESS,2017,25(3):1778-1788.
APA YONG-NAN SUN.,YANG ZOU.,GENG CHEN.,JIAN-SHUN TANG.,HAI-QIAO NI.,...&GUANG-CAN GUO.(2017).Measurement of the inhomogeneous broadening of a bi-exciton state in a quantum dot using Franson-type nonlocal interference.OPTICS EXPRESS,25(3),1778-1788.
MLA YONG-NAN SUN,et al."Measurement of the inhomogeneous broadening of a bi-exciton state in a quantum dot using Franson-type nonlocal interference".OPTICS EXPRESS 25.3(2017):1778-1788.
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