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Electric field induced electronic properties modification of ZrS2/HfS2 van der Waals heterostructure | |
Jimin Shang; Shuai Zhang; Xuerui Cheng; Zhongming Wei; Jingbo Li | |
2017 | |
Source Publication | RSC Advances
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Volume | 7Pages:14625–14630 |
Subject Area | 半导体物理 |
Indexed By | SCI |
Date Available | 2018-06-15 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/28601 |
Collection | 半导体超晶格国家重点实验室 |
Recommended Citation GB/T 7714 | Jimin Shang,Shuai Zhang,Xuerui Cheng,et al. Electric field induced electronic properties modification of ZrS2/HfS2 van der Waals heterostructure[J]. RSC Advances,2017,7:14625–14630. |
APA | Jimin Shang,Shuai Zhang,Xuerui Cheng,Zhongming Wei,&Jingbo Li.(2017).Electric field induced electronic properties modification of ZrS2/HfS2 van der Waals heterostructure.RSC Advances,7,14625–14630. |
MLA | Jimin Shang,et al."Electric field induced electronic properties modification of ZrS2/HfS2 van der Waals heterostructure".RSC Advances 7(2017):14625–14630. |
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Electric field induc(1107KB) | 限制开放 | License | Application Full Text |
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