SEMI OpenIR  > 半导体超晶格国家重点实验室
Layer-Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination
Xiao-Li Li; Wen-Peng Han; Jiang-Bin Wu; Xiao-Fen Qiao; Jun Zhang; Ping-Heng Tan
2017
Source PublicationAdv. Funct. Mater.
Volume27Issue:19Pages:1604468(1 of 23)
Subject Area半导体物理
Indexed BySCI
Date Available2018-06-15
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/28553
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
Xiao-Li Li,Wen-Peng Han,Jiang-Bin Wu,et al. Layer-Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination[J]. Adv. Funct. Mater.,2017,27(19):1604468(1 of 23).
APA Xiao-Li Li,Wen-Peng Han,Jiang-Bin Wu,Xiao-Fen Qiao,Jun Zhang,&Ping-Heng Tan.(2017).Layer-Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination.Adv. Funct. Mater.,27(19),1604468(1 of 23).
MLA Xiao-Li Li,et al."Layer-Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination".Adv. Funct. Mater. 27.19(2017):1604468(1 of 23).
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