Knowledge Management System Of Institute of Semiconductors,CAS
Layer-Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination | |
Xiao-Li Li; Wen-Peng Han; Jiang-Bin Wu; Xiao-Fen Qiao; Jun Zhang; Ping-Heng Tan | |
2017 | |
Source Publication | Adv. Funct. Mater.
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Volume | 27Issue:19Pages:1604468(1 of 23) |
Subject Area | 半导体物理 |
Indexed By | SCI |
Date Available | 2018-06-15 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/28553 |
Collection | 半导体超晶格国家重点实验室 |
Recommended Citation GB/T 7714 | Xiao-Li Li,Wen-Peng Han,Jiang-Bin Wu,et al. Layer-Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination[J]. Adv. Funct. Mater.,2017,27(19):1604468(1 of 23). |
APA | Xiao-Li Li,Wen-Peng Han,Jiang-Bin Wu,Xiao-Fen Qiao,Jun Zhang,&Ping-Heng Tan.(2017).Layer-Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination.Adv. Funct. Mater.,27(19),1604468(1 of 23). |
MLA | Xiao-Li Li,et al."Layer-Number Dependent Optical Properties of 2D Materials and Their Application for Thickness Determination".Adv. Funct. Mater. 27.19(2017):1604468(1 of 23). |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
Layer-number-depende(5838KB) | 限制开放 | License | Application Full Text |
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