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PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers
Bo Sun; Xuejun Fan; Cheng Qian; Guoqi Zhang
2016
Source PublicationIEEE Transactions on Industrial Electronics
Volume63Issue:11Pages:6726-6735
Subject Area半导体器件
Indexed BySCI
Date Available2017-03-16
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/28114
Collection中科院半导体照明研发中心
Recommended Citation
GB/T 7714
Bo Sun,Xuejun Fan,Cheng Qian,et al. PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers[J]. IEEE Transactions on Industrial Electronics,2016,63(11):6726-6735.
APA Bo Sun,Xuejun Fan,Cheng Qian,&Guoqi Zhang.(2016).PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers.IEEE Transactions on Industrial Electronics,63(11),6726-6735.
MLA Bo Sun,et al."PoF-Simulation-Assisted Reliability Prediction for Electrolytic Capacitor in LED Drivers".IEEE Transactions on Industrial Electronics 63.11(2016):6726-6735.
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