SEMI OpenIR  > 中科院半导体照明研发中心
An accelerated test method of luminous flux depreciation for LED luminaires and lamps
C. Qian; X.J.Fan; J.J.Fan; C.A.Yuan; G.Q.Zhang
2016
Source PublicationReliability Engineering and System Safety
Volume147Pages:84-92
Subject Area半导体器件
Indexed BySCI
Date Available2017-03-16
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/28091
Collection中科院半导体照明研发中心
Recommended Citation
GB/T 7714
C. Qian,X.J.Fan,J.J.Fan,et al. An accelerated test method of luminous flux depreciation for LED luminaires and lamps[J]. Reliability Engineering and System Safety,2016,147:84-92.
APA C. Qian,X.J.Fan,J.J.Fan,C.A.Yuan,&G.Q.Zhang.(2016).An accelerated test method of luminous flux depreciation for LED luminaires and lamps.Reliability Engineering and System Safety,147,84-92.
MLA C. Qian,et al."An accelerated test method of luminous flux depreciation for LED luminaires and lamps".Reliability Engineering and System Safety 147(2016):84-92.
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