Degradation and corresponding failure mechanism for GaN-based LEDs | |
Jiajia Fu; Lixia Zhao; Haicheng Cao; Xuejiao Sun; Baojuan Sun; Junxi Wang; Jinmin Li | |
2016 | |
Source Publication | AIP Advances
![]() |
Volume | 6Issue:5Pages:055219 |
Subject Area | 半导体器件 |
Indexed By | SCI |
Date Available | 2017-03-16 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/28084 |
Collection | 中科院半导体照明研发中心 |
Recommended Citation GB/T 7714 | Jiajia Fu,Lixia Zhao,Haicheng Cao,et al. Degradation and corresponding failure mechanism for GaN-based LEDs[J]. AIP Advances,2016,6(5):055219. |
APA | Jiajia Fu.,Lixia Zhao.,Haicheng Cao.,Xuejiao Sun.,Baojuan Sun.,...&Jinmin Li.(2016).Degradation and corresponding failure mechanism for GaN-based LEDs.AIP Advances,6(5),055219. |
MLA | Jiajia Fu,et al."Degradation and corresponding failure mechanism for GaN-based LEDs".AIP Advances 6.5(2016):055219. |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
Degradation and corr(8377KB) | 限制开放 | License | Application Full Text |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment