SEMI OpenIR  > 半导体超晶格国家重点实验室
Review on the Raman spectroscopy of different types of layered materials
Xin Zhang; Qing-Hai Tan; Jiang-Bin Wu; Wei Shi; Ping-Heng Tan
2016
Source PublicationNanoscale.
Volume8Issue:12Pages:6435-6450
Subject Area半导体物理
Indexed BySCI
Date Available2017-03-16
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/28037
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
Xin Zhang,Qing-Hai Tan,Jiang-Bin Wu,et al. Review on the Raman spectroscopy of different types of layered materials[J]. Nanoscale.,2016,8(12):6435-6450.
APA Xin Zhang,Qing-Hai Tan,Jiang-Bin Wu,Wei Shi,&Ping-Heng Tan.(2016).Review on the Raman spectroscopy of different types of layered materials.Nanoscale.,8(12),6435-6450.
MLA Xin Zhang,et al."Review on the Raman spectroscopy of different types of layered materials".Nanoscale. 8.12(2016):6435-6450.
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