Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition

	Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition
	Jiang-Bin Wu; Huan Wang; Xiao-Li Li; Hailin Peng; Ping-Heng Tan
	2016
Source Publication	Carbon
Volume	110 Pages:225-231
Subject Area	半导体物理
Indexed By	SCI
Date Available	2017-03-16
Document Type	期刊论文
Identifier	http://ir.semi.ac.cn/handle/172111/28036
Collection	半导体超晶格国家重点实验室
Recommended Citation GB/T 7714	Jiang-Bin Wu,Huan Wang,Xiao-Li Li,et al. Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition[J]. Carbon,2016,110:225-231.
APA	Jiang-Bin Wu,Huan Wang,Xiao-Li Li,Hailin Peng,&Ping-Heng Tan.(2016).Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition.Carbon,110,225-231.
MLA	Jiang-Bin Wu,et al."Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition".Carbon 110(2016):225-231.

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