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Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition
Jiang-Bin Wu; Huan Wang; Xiao-Li Li; Hailin Peng; Ping-Heng Tan
2016
Source PublicationCarbon
Volume110Pages:225-231
Subject Area半导体物理
Indexed BySCI
Date Available2017-03-16
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/28036
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
Jiang-Bin Wu,Huan Wang,Xiao-Li Li,et al. Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition[J]. Carbon,2016,110:225-231.
APA Jiang-Bin Wu,Huan Wang,Xiao-Li Li,Hailin Peng,&Ping-Heng Tan.(2016).Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition.Carbon,110,225-231.
MLA Jiang-Bin Wu,et al."Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition".Carbon 110(2016):225-231.
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