Knowledge Management System Of Institute of Semiconductors,CAS
Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition | |
Jiang-Bin Wu; Huan Wang; Xiao-Li Li; Hailin Peng; Ping-Heng Tan | |
2016 | |
Source Publication | Carbon
![]() |
Volume | 110Pages:225-231 |
Subject Area | 半导体物理 |
Indexed By | SCI |
Date Available | 2017-03-16 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/28036 |
Collection | 半导体超晶格国家重点实验室 |
Recommended Citation GB/T 7714 | Jiang-Bin Wu,Huan Wang,Xiao-Li Li,et al. Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition[J]. Carbon,2016,110:225-231. |
APA | Jiang-Bin Wu,Huan Wang,Xiao-Li Li,Hailin Peng,&Ping-Heng Tan.(2016).Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition.Carbon,110,225-231. |
MLA | Jiang-Bin Wu,et al."Raman spectroscopic characterization of stacking configuration and interlayer coupling of twisted multilayer graphene grown by chemical vapor deposition".Carbon 110(2016):225-231. |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
Raman spectroscopic (1951KB) | 限制开放 | License | Application Full Text |
Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.
Edit Comment