Dielectric-Grating-Coupled Surface Plasmon Resonance From the Back Side of the Metal Film for Ultrasensitive Sensing | |
Shaohua Pi; Xie Zeng; Nan Zhang; Dengxin Ji; Borui Chen; Haomin Song; Alec Cheney; Yun Xu; Suhua Jiang; Dalin Sun; Yun Song; Qiaoqiang Gan | |
2016 | |
Source Publication | IEEE Photonics Journal
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Volume | 8Issue:1Pages:4800207 |
Subject Area | 半导体材料 |
Indexed By | SCI |
Date Available | 2017-03-16 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/27909 |
Collection | 纳米光电子实验室 |
Recommended Citation GB/T 7714 | Shaohua Pi,Xie Zeng,Nan Zhang,et al. Dielectric-Grating-Coupled Surface Plasmon Resonance From the Back Side of the Metal Film for Ultrasensitive Sensing[J]. IEEE Photonics Journal,2016,8(1):4800207. |
APA | Shaohua Pi.,Xie Zeng.,Nan Zhang.,Dengxin Ji.,Borui Chen.,...&Qiaoqiang Gan.(2016).Dielectric-Grating-Coupled Surface Plasmon Resonance From the Back Side of the Metal Film for Ultrasensitive Sensing.IEEE Photonics Journal,8(1),4800207. |
MLA | Shaohua Pi,et al."Dielectric-Grating-Coupled Surface Plasmon Resonance From the Back Side of the Metal Film for Ultrasensitive Sensing".IEEE Photonics Journal 8.1(2016):4800207. |
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Dielectric-Grating-C(538KB) | 限制开放 | License | Application Full Text |
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