Analysis of Substrate Effect in Field Effect Transistor Terahertz Detectors | |
Bowen Zhang; Wei Yan; Zhaofeng Li; Long Bai; Fuhua Yang | |
2016 | |
Source Publication | IEEE Journal of Selected Topics in Quantum Electronics
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Subject Area | 微电子学 |
Indexed By | SCI |
Date Available | 2017-03-16 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/27905 |
Collection | 半导体集成技术工程研究中心 |
Recommended Citation GB/T 7714 | Bowen Zhang,Wei Yan,Zhaofeng Li,et al. Analysis of Substrate Effect in Field Effect Transistor Terahertz Detectors[J]. IEEE Journal of Selected Topics in Quantum Electronics,2016. |
APA | Bowen Zhang,Wei Yan,Zhaofeng Li,Long Bai,&Fuhua Yang.(2016).Analysis of Substrate Effect in Field Effect Transistor Terahertz Detectors.IEEE Journal of Selected Topics in Quantum Electronics. |
MLA | Bowen Zhang,et al."Analysis of Substrate Effect in Field Effect Transistor Terahertz Detectors".IEEE Journal of Selected Topics in Quantum Electronics (2016). |
Files in This Item: | ||||||
File Name/Size | DocType | Version | Access | License | ||
Analysis of Substrat(2160KB) | 限制开放 | License | Application Full Text |
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