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Analysis of Substrate Effect in Field Effect Transistor Terahertz Detectors
Bowen Zhang; Wei Yan; Zhaofeng Li; Long Bai; Fuhua Yang
2016
Source PublicationIEEE Journal of Selected Topics in Quantum Electronics
Subject Area微电子学
Indexed BySCI
Date Available2017-03-16
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/27905
Collection半导体集成技术工程研究中心
Recommended Citation
GB/T 7714
Bowen Zhang,Wei Yan,Zhaofeng Li,et al. Analysis of Substrate Effect in Field Effect Transistor Terahertz Detectors[J]. IEEE Journal of Selected Topics in Quantum Electronics,2016.
APA Bowen Zhang,Wei Yan,Zhaofeng Li,Long Bai,&Fuhua Yang.(2016).Analysis of Substrate Effect in Field Effect Transistor Terahertz Detectors.IEEE Journal of Selected Topics in Quantum Electronics.
MLA Bowen Zhang,et al."Analysis of Substrate Effect in Field Effect Transistor Terahertz Detectors".IEEE Journal of Selected Topics in Quantum Electronics (2016).
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