| Analysis of Substrate Effect in Field Effect Transistor Terahertz Detectors | |
| Bowen Zhang; Wei Yan; Zhaofeng Li; Long Bai; Fuhua Yang | |
| 2016 | |
| Source Publication | IEEE Journal of Selected Topics in Quantum Electronics
 |
| Subject Area | 微电子学 |
| Indexed By | SCI |
| Date Available | 2017-03-16 |
| Document Type | 期刊论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/27905 |
| Collection | 半导体集成技术工程研究中心 |
| Recommended Citation GB/T 7714 | Bowen Zhang,Wei Yan,Zhaofeng Li,et al. Analysis of Substrate Effect in Field Effect Transistor Terahertz Detectors[J]. IEEE Journal of Selected Topics in Quantum Electronics,2016. |
| APA | Bowen Zhang,Wei Yan,Zhaofeng Li,Long Bai,&Fuhua Yang.(2016).Analysis of Substrate Effect in Field Effect Transistor Terahertz Detectors.IEEE Journal of Selected Topics in Quantum Electronics. |
| MLA | Bowen Zhang,et al."Analysis of Substrate Effect in Field Effect Transistor Terahertz Detectors".IEEE Journal of Selected Topics in Quantum Electronics (2016). |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Analysis of Substrat（2160KB） | 限制开放 | License | Application Full Text | |||
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