SEMI OpenIR  > 中科院半导体材料科学重点实验室
Subset geometric phase analysis method for deformation evaluation of HRTEM images
Hongye Zhang; Zhanwei Liu; Huihui Wen; Huimin Xie; Chao Liu
2016
Source PublicationUltramicroscopy
Volume171Pages:34-42
Subject Area半导体材料
Indexed BySCI
Date Available2017-03-10
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/27757
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
Hongye Zhang,Zhanwei Liu,Huihui Wen,et al. Subset geometric phase analysis method for deformation evaluation of HRTEM images[J]. Ultramicroscopy,2016,171:34-42.
APA Hongye Zhang,Zhanwei Liu,Huihui Wen,Huimin Xie,&Chao Liu.(2016).Subset geometric phase analysis method for deformation evaluation of HRTEM images.Ultramicroscopy,171,34-42.
MLA Hongye Zhang,et al."Subset geometric phase analysis method for deformation evaluation of HRTEM images".Ultramicroscopy 171(2016):34-42.
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