SEMI OpenIR  > 中科院半导体材料科学重点实验室
Reconstruction of GaAs/AlAs supperlattice multilayer structure by quantification of AES and SIMS sputter depth profiles
H.L. Kang; J.B. Lao; Z.P. Li; W.Q. Yao; C. Liu; J.Y. Wang
2016
Source PublicationApplied Surface Science
Volume388Pages:584-588
Subject Area半导体材料
Indexed BySCI
Date Available2017-03-10
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/27756
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
H.L. Kang,J.B. Lao,Z.P. Li,et al. Reconstruction of GaAs/AlAs supperlattice multilayer structure by quantification of AES and SIMS sputter depth profiles[J]. Applied Surface Science,2016,388:584-588.
APA H.L. Kang,J.B. Lao,Z.P. Li,W.Q. Yao,C. Liu,&J.Y. Wang.(2016).Reconstruction of GaAs/AlAs supperlattice multilayer structure by quantification of AES and SIMS sputter depth profiles.Applied Surface Science,388,584-588.
MLA H.L. Kang,et al."Reconstruction of GaAs/AlAs supperlattice multilayer structure by quantification of AES and SIMS sputter depth profiles".Applied Surface Science 388(2016):584-588.
Files in This Item:
File Name/Size DocType Version Access License
Reconstruction of Ga(2037KB) 限制开放LicenseApplication Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[H.L. Kang]'s Articles
[J.B. Lao]'s Articles
[Z.P. Li]'s Articles
Baidu academic
Similar articles in Baidu academic
[H.L. Kang]'s Articles
[J.B. Lao]'s Articles
[Z.P. Li]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[H.L. Kang]'s Articles
[J.B. Lao]'s Articles
[Z.P. Li]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.