SEMI OpenIR  > 中科院半导体材料科学重点实验室
Reflectance difference spectroscopy microscope for circular defects on InN films
Wei Huang; Yu Liu; Laipan Zhu; Xiantong Zheng Yuan Li; Qing Wu; Yixin Wang; Xinqiang Wang; Yonghai Chen
2016
Source PublicationOptics Express
Volume24Issue:13Pages:15059-15070
Subject Area半导体材料
Indexed BySCI
Date Available2017-03-10
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/27682
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
Wei Huang,Yu Liu,Laipan Zhu,et al. Reflectance difference spectroscopy microscope for circular defects on InN films[J]. Optics Express,2016,24(13):15059-15070.
APA Wei Huang.,Yu Liu.,Laipan Zhu.,Xiantong Zheng Yuan Li.,Qing Wu.,...&Yonghai Chen.(2016).Reflectance difference spectroscopy microscope for circular defects on InN films.Optics Express,24(13),15059-15070.
MLA Wei Huang,et al."Reflectance difference spectroscopy microscope for circular defects on InN films".Optics Express 24.13(2016):15059-15070.
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