SEMI OpenIR  > 光电子研究发展中心
基于Kerr效应的电场无源测量装置
张志珂; 刘宇; 祝宁华
Rights Holder中国科学院半导体所
Date Available2016-09-12
Country中国
Subtype发明
Subject Area光电子学
Application Date2014-11-20
Application NumberCN201410669694.8
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/27458
Collection光电子研究发展中心
Recommended Citation
GB/T 7714
张志珂,刘宇,祝宁华. 基于Kerr效应的电场无源测量装置.
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基于Kerr效应的电场无源测量装置.pd(367KB) 限制开放LicenseApplication Full Text
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