SEMI OpenIR  > 中科院半导体材料科学重点实验室
光弹调制测量系统
张宏毅; 陈涌海; 高寒松
Rights Holder中国科学院半导体所
Date Available2016-08-30
Country中国
Subtype发明
Subject Area半导体材料
Application Date2014-12-25
Application NumberCN201410821124.6
Document Type专利
Identifierhttp://ir.semi.ac.cn/handle/172111/27242
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
张宏毅,陈涌海,高寒松. 光弹调制测量系统.
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光弹调制测量系统.pdf(424KB) 限制开放LicenseApplication Full Text
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