SEMI OpenIR  > 半导体超晶格国家重点实验室
Thickness-dependent Raman spectra, transport properties and infrared photoresponse of few-layer black phosphorus
Sijie Liu; Nengjie Huo; Sheng Gan; Yan Li; Zhongming Wei; Beiju Huang; Jian Liu; Jingbo Li; Hongda Chen
2015
Source PublicationJournal of Materials Chemistry C
Volume3Issue:42Pages:10974-10980
Subject Area半导体物理
Indexed BySCI
Language英语
Date Available2016-03-29
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/26921
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
Sijie Liu,Nengjie Huo,Sheng Gan,et al. Thickness-dependent Raman spectra, transport properties and infrared photoresponse of few-layer black phosphorus[J]. Journal of Materials Chemistry C,2015,3(42):10974-10980.
APA Sijie Liu.,Nengjie Huo.,Sheng Gan.,Yan Li.,Zhongming Wei.,...&Hongda Chen.(2015).Thickness-dependent Raman spectra, transport properties and infrared photoresponse of few-layer black phosphorus.Journal of Materials Chemistry C,3(42),10974-10980.
MLA Sijie Liu,et al."Thickness-dependent Raman spectra, transport properties and infrared photoresponse of few-layer black phosphorus".Journal of Materials Chemistry C 3.42(2015):10974-10980.
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