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Layer number identification of intrinsic and defective multilayered graphenes up to 100 layers by the Raman mode intensity from substrates
Xiao-Li Li; Xiao-Fen Qiao; Wen-Peng Han; Yan Lu; Qing-Hai Tan; Xue-Lu Liu; Ping-Heng Tan
2015
Source PublicationNanoscale
Volume7Issue:17Pages:8135-8141
Subject Area半导体物理
Indexed BySCI
Language英语
Date Available2016-03-29
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/26887
Collection半导体超晶格国家重点实验室
Recommended Citation
GB/T 7714
Xiao-Li Li,Xiao-Fen Qiao,Wen-Peng Han,et al. Layer number identification of intrinsic and defective multilayered graphenes up to 100 layers by the Raman mode intensity from substrates[J]. Nanoscale,2015,7(17):8135-8141.
APA Xiao-Li Li.,Xiao-Fen Qiao.,Wen-Peng Han.,Yan Lu.,Qing-Hai Tan.,...&Ping-Heng Tan.(2015).Layer number identification of intrinsic and defective multilayered graphenes up to 100 layers by the Raman mode intensity from substrates.Nanoscale,7(17),8135-8141.
MLA Xiao-Li Li,et al."Layer number identification of intrinsic and defective multilayered graphenes up to 100 layers by the Raman mode intensity from substrates".Nanoscale 7.17(2015):8135-8141.
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