| Implantation induced defects and electrical properties of Sb-implanted ZnO | |
| Hui Xie; Tong Liu; JingMing Liu; KeWei Cao; ZhiYuan Dong; Jun Yang; YouWen Zhao | |
| 2015 | |
| Source Publication | SCIENCE CHINA Technological Sciences
 |
| Volume | 58Issue:8Pages:1333-1338 |
| Subject Area | 半导体材料 |
| Indexed By | SCI |
| Language | 英语 |
| Date Available | 2016-03-29 |
| Document Type | 期刊论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/26862 |
| Collection | 中科院半导体材料科学重点实验室 |
| Recommended Citation GB/T 7714 | Hui Xie,Tong Liu,JingMing Liu,et al. Implantation induced defects and electrical properties of Sb-implanted ZnO[J]. SCIENCE CHINA Technological Sciences,2015,58(8):1333-1338. |
| APA | Hui Xie.,Tong Liu.,JingMing Liu.,KeWei Cao.,ZhiYuan Dong.,...&YouWen Zhao.(2015).Implantation induced defects and electrical properties of Sb-implanted ZnO.SCIENCE CHINA Technological Sciences,58(8),1333-1338. |
| MLA | Hui Xie,et al."Implantation induced defects and electrical properties of Sb-implanted ZnO".SCIENCE CHINA Technological Sciences 58.8(2015):1333-1338. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Implantation induced（765KB） | 限制开放 | License | Application Full Text | |||
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