SEMI OpenIR  > 中科院半导体材料科学重点实验室
Structural, Raman scattering and magnetic characteristics of Er+-implanted GaN thin films
Chao Liu; Xingguo Gao; Dongyan Tao; Junxi Wang; Yiping Zeng
2015
Source PublicationJournal of Alloys and Compounds
Volume618Pages:533-536
Subject Area半导体材料
Indexed BySCI
Language英语
Date Available2016-03-29
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/26843
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
Chao Liu,Xingguo Gao,Dongyan Tao,et al. Structural, Raman scattering and magnetic characteristics of Er+-implanted GaN thin films[J]. Journal of Alloys and Compounds,2015,618:533-536.
APA Chao Liu,Xingguo Gao,Dongyan Tao,Junxi Wang,&Yiping Zeng.(2015).Structural, Raman scattering and magnetic characteristics of Er+-implanted GaN thin films.Journal of Alloys and Compounds,618,533-536.
MLA Chao Liu,et al."Structural, Raman scattering and magnetic characteristics of Er+-implanted GaN thin films".Journal of Alloys and Compounds 618(2015):533-536.
Files in This Item:
File Name/Size DocType Version Access License
Structural, Raman sc(416KB) 限制开放LicenseApplication Full Text
Related Services
Recommend this item
Bookmark
Usage statistics
Export to Endnote
Google Scholar
Similar articles in Google Scholar
[Chao Liu]'s Articles
[Xingguo Gao]'s Articles
[Dongyan Tao]'s Articles
Baidu academic
Similar articles in Baidu academic
[Chao Liu]'s Articles
[Xingguo Gao]'s Articles
[Dongyan Tao]'s Articles
Bing Scholar
Similar articles in Bing Scholar
[Chao Liu]'s Articles
[Xingguo Gao]'s Articles
[Dongyan Tao]'s Articles
Terms of Use
No data!
Social Bookmark/Share
All comments (0)
No comment.
 

Items in the repository are protected by copyright, with all rights reserved, unless otherwise indicated.