| Structural, Raman scattering and magnetic characteristics of Er+-implanted GaN thin films | |
| Chao Liu; Xingguo Gao; Dongyan Tao; Junxi Wang; Yiping Zeng | |
| 2015 | |
| Source Publication | Journal of Alloys and Compounds
 |
| Volume | 618Pages:533-536 |
| Subject Area | 半导体材料 |
| Indexed By | SCI |
| Language | 英语 |
| Date Available | 2016-03-29 |
| Document Type | 期刊论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/26843 |
| Collection | 中科院半导体材料科学重点实验室 |
| Recommended Citation GB/T 7714 | Chao Liu,Xingguo Gao,Dongyan Tao,et al. Structural, Raman scattering and magnetic characteristics of Er+-implanted GaN thin films[J]. Journal of Alloys and Compounds,2015,618:533-536. |
| APA | Chao Liu,Xingguo Gao,Dongyan Tao,Junxi Wang,&Yiping Zeng.(2015).Structural, Raman scattering and magnetic characteristics of Er+-implanted GaN thin films.Journal of Alloys and Compounds,618,533-536. |
| MLA | Chao Liu,et al."Structural, Raman scattering and magnetic characteristics of Er+-implanted GaN thin films".Journal of Alloys and Compounds 618(2015):533-536. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Structural, Raman sc（416KB） | 限制开放 | License | Application Full Text | |||
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