| Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators | |
| Huitao Wang; Dan Lu; Hao Wang; Fei Guo; Songtao Liu; Daibing Zhou; Hongliang Zhu; Wei Wang; Yongguang Huang; Ruikang Zhang; Chen Ji | |
| 2015 | |
| Source Publication | IEEE TRANSACTIONS ON ELECTRON DEVICES
 |
| Volume | 62Issue:11Pages:3756-3759 |
| Subject Area | 半导体材料 |
| Indexed By | SCI |
| Language | 英语 |
| Date Available | 2016-03-29 |
| Document Type | 期刊论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/26839 |
| Collection | 中科院半导体材料科学重点实验室 |
| Recommended Citation GB/T 7714 | Huitao Wang,Dan Lu,Hao Wang,et al. Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES,2015,62(11):3756-3759. |
| APA | Huitao Wang.,Dan Lu.,Hao Wang.,Fei Guo.,Songtao Liu.,...&Chen Ji.(2015).Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators.IEEE TRANSACTIONS ON ELECTRON DEVICES,62(11),3756-3759. |
| MLA | Huitao Wang,et al."Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators".IEEE TRANSACTIONS ON ELECTRON DEVICES 62.11(2015):3756-3759. |
| Files in This Item: | ||||||
| File Name/Size | DocType | Version | Access | License | ||
| Modeling and Experim（1168KB） | 限制开放 | License | Application Full Text | |||
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