Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators | |
Huitao Wang; Dan Lu; Hao Wang; Fei Guo; Songtao Liu; Daibing Zhou; Hongliang Zhu; Wei Wang; Yongguang Huang; Ruikang Zhang; Chen Ji | |
2015 | |
Source Publication | IEEE TRANSACTIONS ON ELECTRON DEVICES
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Volume | 62Issue:11Pages:3756-3759 |
Subject Area | 半导体材料 |
Indexed By | SCI |
Language | 英语 |
Date Available | 2016-03-29 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/26839 |
Collection | 中科院半导体材料科学重点实验室 |
Recommended Citation GB/T 7714 | Huitao Wang,Dan Lu,Hao Wang,et al. Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES,2015,62(11):3756-3759. |
APA | Huitao Wang.,Dan Lu.,Hao Wang.,Fei Guo.,Songtao Liu.,...&Chen Ji.(2015).Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators.IEEE TRANSACTIONS ON ELECTRON DEVICES,62(11),3756-3759. |
MLA | Huitao Wang,et al."Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators".IEEE TRANSACTIONS ON ELECTRON DEVICES 62.11(2015):3756-3759. |
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Modeling and Experim(1168KB) | 限制开放 | License | Application Full Text |
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