SEMI OpenIR  > 中科院半导体材料科学重点实验室
Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators
Huitao Wang; Dan Lu; Hao Wang; Fei Guo; Songtao Liu; Daibing Zhou; Hongliang Zhu; Wei Wang; Yongguang Huang; Ruikang Zhang; Chen Ji
2015
Source PublicationIEEE TRANSACTIONS ON ELECTRON DEVICES
Volume62Issue:11Pages:3756-3759
Subject Area半导体材料
Indexed BySCI
Language英语
Date Available2016-03-29
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/26839
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
Huitao Wang,Dan Lu,Hao Wang,et al. Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES,2015,62(11):3756-3759.
APA Huitao Wang.,Dan Lu.,Hao Wang.,Fei Guo.,Songtao Liu.,...&Chen Ji.(2015).Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators.IEEE TRANSACTIONS ON ELECTRON DEVICES,62(11),3756-3759.
MLA Huitao Wang,et al."Modeling and Experiment Verification of Lateral Current Spreading Effect in Ridge Waveguide Electroabsorption Modulators".IEEE TRANSACTIONS ON ELECTRON DEVICES 62.11(2015):3756-3759.
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