SEMI OpenIR  > 中科院半导体材料科学重点实验室
Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy
H.L. Gao; X.W. Zhang; J.H. Meng; Z.G. Yin; L.Q. Zhang; J.L. Wu; X. Liu
2015
Source PublicationThin Solid Films
Volume576Pages:81-87
Subject Area半导体材料
Indexed BySCI
Language英语
Date Available2016-03-23
Document Type期刊论文
Identifierhttp://ir.semi.ac.cn/handle/172111/26809
Collection中科院半导体材料科学重点实验室
Recommended Citation
GB/T 7714
H.L. Gao,X.W. Zhang,J.H. Meng,et al. Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy[J]. Thin Solid Films,2015,576:81-87.
APA H.L. Gao.,X.W. Zhang.,J.H. Meng.,Z.G. Yin.,L.Q. Zhang.,...&X. Liu.(2015).Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy.Thin Solid Films,576,81-87.
MLA H.L. Gao,et al."Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy".Thin Solid Films 576(2015):81-87.
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