| Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy | |
| H.L. Gao; X.W. Zhang; J.H. Meng; Z.G. Yin; L.Q. Zhang; J.L. Wu; X. Liu | |
| 2015 | |
| Source Publication | Thin Solid Films
 |
| Volume | 576Pages:81-87 |
| Subject Area | 半导体材料 |
| Indexed By | SCI |
| Language | 英语 |
| Date Available | 2016-03-23 |
| Document Type | 期刊论文 |
| Identifier | http://ir.semi.ac.cn/handle/172111/26809 |
| Collection | 中科院半导体材料科学重点实验室 |
| Recommended Citation GB/T 7714 | H.L. Gao,X.W. Zhang,J.H. Meng,et al. Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy[J]. Thin Solid Films,2015,576:81-87. |
| APA | H.L. Gao.,X.W. Zhang.,J.H. Meng.,Z.G. Yin.,L.Q. Zhang.,...&X. Liu.(2015).Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy.Thin Solid Films,576,81-87. |
| MLA | H.L. Gao,et al."Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy".Thin Solid Films 576(2015):81-87. |
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| Quantitative charact（3217KB） | 限制开放 | License | Application Full Text | |||
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