Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy | |
H.L. Gao; X.W. Zhang; J.H. Meng; Z.G. Yin; L.Q. Zhang; J.L. Wu; X. Liu | |
2015 | |
Source Publication | Thin Solid Films
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Volume | 576Pages:81-87 |
Subject Area | 半导体材料 |
Indexed By | SCI |
Language | 英语 |
Date Available | 2016-03-23 |
Document Type | 期刊论文 |
Identifier | http://ir.semi.ac.cn/handle/172111/26809 |
Collection | 中科院半导体材料科学重点实验室 |
Recommended Citation GB/T 7714 | H.L. Gao,X.W. Zhang,J.H. Meng,et al. Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy[J]. Thin Solid Films,2015,576:81-87. |
APA | H.L. Gao.,X.W. Zhang.,J.H. Meng.,Z.G. Yin.,L.Q. Zhang.,...&X. Liu.(2015).Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy.Thin Solid Films,576,81-87. |
MLA | H.L. Gao,et al."Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy".Thin Solid Films 576(2015):81-87. |
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